Bell Labs nanofabrication capabilities



Alcatel-Lucent

Bell Labs

NANOFABRICATION

New Jersey Commission on Science and Technology

New Jersey Economic Development Authority

New Jersey
Technology Council




Bell Labs' nanofabrication capabilities span a wide range including nano-electronic and optic devices. We leverage the experience gained in many internal and government research programs. The NJNC facility can accommodate a range of materials from Silicon over compound semiconductors to novel material such as Graphene and Carbon nanotubes.

We offer complete nano-fabrication services from concept to realization. This includes computer-aided design of lateral structures, patterning using state-of-the-art electron beam and UV stepper lithography, plasma etching, and metallization. Devices are fabricated by experienced staff members in rapid turn-around time.

Our capabilities in detail:

  • CAD layout and pattern translation
  • i-line stepper lithography (3in diameter)
  • contact lithography (10mm - 3in)
  • sub-10 nm electron beam lithography (10 mm - 300mm)
  • Metal evaporation and sputtering (10mm-12 inch)
  • Dielectric deposition (10mm - 3in)
  • ICP etching (10mm - 3in)
  • Backside wafer processing and facet AR coating for optical devices
  • Cross-sectioning and top-down high resolution electron microscopy
Demonstrated electronics
  • Indium Phosphide HBT circuits up to 150 GHz
  • InP and Gallium Nitride HFET with T-gate down to 100 nm

Optics

  • Integrated photonic circuits in Indium Phosphide, Silica, and Silicon (SOI)
  • opto-electronic components including QCL, High-speed modulators, and Detectors

Biological applications

  • Zero-Mode Waveguide structures of 10 nm radius for single-molecule spectroscopy
  • Patterned Nanoparticle field-enhancing structures for fluorescence analysis

Advanced CMOS technology

  • 32 nm random patterns on 300mm wafers

Device testing facilities

  • In-house on-chip DC, RF and optical test systems up to 350 GHz
  • Reliability assessment of novel devices
  • Device Modeling and performance analysis
  • High resolution SEM including EDX analysis







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© 2008 New Jersey Nanotechnology Consortium (njnc)